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In-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challenges

dc.contributor.authorBenedetti, Alessandro
dc.contributor.authorBender, Hugo
dc.date.accessioned2021-10-15T04:00:45Z
dc.date.available2021-10-15T04:00:45Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7197
dc.sourceIIOimport
dc.titleIn-situ plucker system for preparation of TEM samples by FIB: new applications, future prospects and challenges
dc.typeOral presentation
dc.contributor.imecauthorBender, Hugo
dc.source.peerreviewno
dc.source.conferenceEuropean Focused Ion Beam Users Group - EFUG
dc.source.conferencedate5/10/2003
dc.source.conferencelocationArcachon France
imec.availabilityPublished - imec


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