Authors

Libezny, Milan; Kaniava, Arvydas; Kissinger, G.; Nijs, Johan; Claeys, Cor; Vanhellemont, Jan

Conference

ALTECH 95: Analytical Techniques for Semiconductor Materials and Process Characterization II. Proceedings of the Satellite Sympo

Title

PL study of oxygen related defects in silicon

Publication type

Proceedings paper

Embargo date

9999-12-31