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dc.contributor.authorBoudart, B.
dc.contributor.authorLlibre, J.F.
dc.contributor.authorBriand, D.
dc.contributor.authorTala-Ighil, B.
dc.contributor.authorToutah, H.
dc.contributor.authorGuhel, Y.
dc.contributor.authorde Jaeger, J.C.
dc.contributor.authorBougrioua, Z.
dc.contributor.authorGermain, Marianne
dc.contributor.authorMoerman, Ingrid
dc.date.accessioned2021-10-15T04:03:30Z
dc.date.available2021-10-15T04:03:30Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7247
dc.sourceIIOimport
dc.titleEvolution de caractéristiques statiques de HEMTs AlGaN/GaN soumis à un stress électrique réalisé à differentes températures
dc.typeOral presentation
dc.contributor.imecauthorMoerman, Ingrid
dc.contributor.orcidimecMoerman, Ingrid::0000-0003-2377-3674
dc.source.peerreviewno
dc.source.conferenceJournées Nationales Micro-Ondes - JNM
dc.source.conferencedate21/05/2003
dc.source.conferencelocationLille France
imec.availabilityPublished - imec


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