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dc.contributor.authorLibezny, Milan
dc.contributor.authorPoortmans, Jef
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorNijs, Johan
dc.contributor.authorPiel, J. P.
dc.contributor.authorvon Känel, H.
dc.date.accessioned2021-09-29T13:09:26Z
dc.date.available2021-09-29T13:09:26Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/727
dc.sourceIIOimport
dc.titleEllipsometric Determination of the Optical Properties of b-FeSi2
dc.typeOral presentation
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.conferenceWISE: Workshop International on Spectroscopic Ellipsometry; February 9-11, 1995; Erlangen, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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