dc.contributor.author | Libezny, Milan | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Nijs, Johan | |
dc.contributor.author | Piel, J. P. | |
dc.contributor.author | von Känel, H. | |
dc.date.accessioned | 2021-09-29T13:09:26Z | |
dc.date.available | 2021-09-29T13:09:26Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/727 | |
dc.source | IIOimport | |
dc.title | Ellipsometric Determination of the Optical Properties of b-FeSi2 | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.source.peerreview | no | |
dc.source.conference | WISE: Workshop International on Spectroscopic Ellipsometry; February 9-11, 1995; Erlangen, Germany. | |
dc.source.conferencelocation | | |
imec.availability | Published - imec | |