dc.contributor.author | Conard, Thierry | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Petry, Jasmine | |
dc.contributor.author | Zhao, Chao | |
dc.contributor.author | Besling, W. | |
dc.contributor.author | Nohira, Hiroshi | |
dc.contributor.author | Richard, Olivier | |
dc.date.accessioned | 2021-10-15T04:11:28Z | |
dc.date.available | 2021-10-15T04:11:28Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7343 | |
dc.source | IIOimport | |
dc.title | TOF-SIMS as a rapid diagnostic tool to monitor the growth mode of thin (high k) films | |
dc.type | Journal article | |
dc.contributor.imecauthor | Conard, Thierry | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.orcidimec | Conard, Thierry::0000-0002-4298-5851 | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.source.peerreview | no | |
dc.source.beginpage | 400 | |
dc.source.endpage | 403 | |
dc.source.journal | Applied Surface Science | |
dc.source.volume | 203-204 | |
imec.availability | Published - imec | |