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Magnetic random access memories: technology assessment and tunnel barrier reliability study
Publication:
Magnetic random access memories: technology assessment and tunnel barrier reliability study
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Date
2003-05
Dissertation
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7706.pdf
5.47 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Das, Johan
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Abstract
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1892
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Acq. date: 2026-02-27
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Statistics
Views
1892
since deposited on 2021-10-15
1
last month
Acq. date: 2026-02-27
Citations