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Magnetic random access memories: technology assessment and tunnel barrier reliability study

dc.contributor.authorDas, Johan
dc.date.accessioned2021-10-15T04:15:32Z
dc.date.available2021-10-15T04:15:32Z
dc.date.issued2003-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7381
dc.sourceIIOimport
dc.titleMagnetic random access memories: technology assessment and tunnel barrier reliability study
dc.typePHD thesis
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorMertens, Robert
dc.contributor.thesisadvisorBorghs, Gustaaf
imec.availabilityPublished - open access


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