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Low-frequency noise characterisation of silicon-on-insulator depletion mode pMOSFETs

dc.contributor.authorLukyanchikova, N. B.
dc.contributor.authorPetrichuk, M. V.
dc.contributor.authorGarbar, N. P.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, C.
dc.date.accessioned2021-09-29T13:09:56Z
dc.date.available2021-09-29T13:09:56Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/738
dc.sourceIIOimport
dc.titleLow-frequency noise characterisation of silicon-on-insulator depletion mode pMOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage247
dc.source.endpage252
dc.source.conferencePhysical and Technical Problems of SOI Structures and Devices; Proceedings of the NATO Advanced Research Workshop on Physical an
dc.source.conferencelocation
imec.availabilityPublished - imec


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