dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Vinckier, Chris | |
dc.contributor.author | Hellin, David | |
dc.date.accessioned | 2021-10-15T04:18:42Z | |
dc.date.available | 2021-10-15T04:18:42Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7407 | |
dc.source | IIOimport | |
dc.title | Saturation effects in total reflection X-ray spectrometry on microdroplet samples | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Hellin, David | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.source.peerreview | no | |
dc.source.conference | Total Reflection X-Ray Fluorescence | |
dc.source.conferencedate | 14/09/2003 | |
dc.source.conferencelocation | Hyogo Japan | |
imec.availability | Published - imec | |