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Integrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes

dc.contributor.authorDe Pauw, Herbert
dc.contributor.authorDe Baets, Johan
dc.contributor.authorVanfleteren, Jan
dc.contributor.authorVan Calster, Andre
dc.date.accessioned2021-10-15T04:23:02Z
dc.date.available2021-10-15T04:23:02Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7444
dc.sourceIIOimport
dc.titleIntegrated optics in a standard MCM-D motherboard technology demonstrated in O/E measurement probes
dc.typeProceedings paper
dc.contributor.imecauthorDe Pauw, Herbert
dc.contributor.imecauthorDe Baets, Johan
dc.contributor.imecauthorVanfleteren, Jan
dc.contributor.imecauthorVan Calster, Andre
dc.contributor.orcidimecVanfleteren, Jan::0000-0002-9654-7304
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceInternational Electronic Packaging Technical Conference and Exhibition
dc.source.conferencedate6/07/2003
dc.source.conferencelocationMaui, HI USA
imec.availabilityPublished - open access
imec.internalnotesProceedings on CD-ROM. IPACK2003-35192


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