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Characterization of charge trapping in SiO2/HfO2 dielectrics
Publication:
Characterization of charge trapping in SiO2/HfO2 dielectrics
Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kerber, Andreas
;
Cartier, Ed
;
Pantisano, Luigi
;
Groeseneken, Guido
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1919
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations
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Views
1919
since deposited on 2021-10-15
Acq. date: 2025-10-24
Citations