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Conference contributions
Effect of bulk trap density on HfO2 reliability and yield
Publication:
Effect of bulk trap density on HfO2 reliability and yield
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Date
2003-12
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Kerber, Andreas
;
Roussel, Philippe
;
Cartier, Ed
;
Kauerauf, Thomas
;
Pantisano, Luigi
;
Groeseneken, Guido
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1982
since deposited on 2021-10-15
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last week
Acq. date: 2026-01-10
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Metrics
Views
1982
since deposited on 2021-10-15
2
last month
1
last week
Acq. date: 2026-01-10
Citations