dc.contributor.author | Dobrovolny, Petr | |
dc.contributor.author | Vandersteen, Gerd | |
dc.contributor.author | Wambacq, Piet | |
dc.contributor.author | Donnay, Stephane | |
dc.date.accessioned | 2021-10-15T04:34:06Z | |
dc.date.available | 2021-10-15T04:34:06Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7526 | |
dc.source | IIOimport | |
dc.title | Analysis and white-box modeling of weakly nonlinear time-varying circuits | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Dobrovolny, Petr | |
dc.contributor.imecauthor | Vandersteen, Gerd | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.imecauthor | Donnay, Stephane | |
dc.contributor.orcidimec | Dobrovolny, Petr::0000-0002-1465-481X | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.contributor.orcidimec | Donnay, Stephane::0000-0003-2489-4793 | |
dc.source.peerreview | no | |
dc.source.beginpage | 624 | |
dc.source.endpage | 629 | |
dc.source.conference | Design, Automation and Test in Europe Conference and Exhibition - DATE | |
dc.source.conferencedate | 3/03/2003 | |
dc.source.conferencelocation | Munich Germany | |
imec.availability | Published - imec | |