dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Teerlinck, Ivo | |
dc.contributor.author | Hurd, Trace | |
dc.contributor.author | Kenis, Karine | |
dc.contributor.author | Schmidt, Harald | |
dc.contributor.author | Rotondaro, Antonio | |
dc.contributor.author | Hall, L. | |
dc.contributor.author | Gräf, D. | |
dc.contributor.author | De Pestel, Freddy | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-09-29T13:10:57Z | |
dc.date.available | 2021-09-29T13:10:57Z | |
dc.date.issued | 1995 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/759 | |
dc.source | IIOimport | |
dc.title | How clean is clean enough? | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Kenis, Karine | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 7 | |
dc.source.conference | Proceedings of SEMICON/West 1995 Technical Seminar: Cleaning Technology for the Submicron Era | |
dc.source.conferencedate | 11/07/1995 | |
dc.source.conferencelocation | San Francisco, CA USA | |
imec.availability | Published - open access | |