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Soft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic

dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T05:06:16Z
dc.date.available2021-10-15T05:06:16Z
dc.date.issued2003-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7716
dc.sourceIIOimport
dc.titleSoft gate oxide breakdown as a lifetime-limiting event in dynamic CMOS logic
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.conferenceSemiconductor Interface Specialists Conference
dc.source.conferencedate4/12/2003
dc.source.conferencelocationWashington, D.C. USA
imec.availabilityPublished - imec


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