dc.contributor.author | Kerber, Andreas | |
dc.contributor.author | Cartier, Eduard | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Rosmeulen, Maarten | |
dc.contributor.author | Pantisano, Luigi | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Kim, Young-Chang | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-15T05:09:01Z | |
dc.date.available | 2021-10-15T05:09:01Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7729 | |
dc.source | IIOimport | |
dc.title | Direct measurement of the inversion charge in MOSFETs: application to mobility extraction in alternative gate dielectrics | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Rosmeulen, Maarten | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
dc.source.peerreview | no | |
dc.source.beginpage | 159 | |
dc.source.endpage | 160 | |
dc.source.conference | VLSI Technology Symposium | |
dc.source.conferencedate | 10/06/2003 | |
dc.source.conferencelocation | Kyoto Japan | |
imec.availability | Published - imec | |