Investigation of charge control related performances in double-gate SOI MOSFETs
dc.contributor.author | Kilchytska, V. | |
dc.contributor.author | Chung, T.M. | |
dc.contributor.author | van Meer, Hans | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Raskin, J.P. | |
dc.contributor.author | Flandre, D. | |
dc.date.accessioned | 2021-10-15T05:10:18Z | |
dc.date.available | 2021-10-15T05:10:18Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7736 | |
dc.source | IIOimport | |
dc.title | Investigation of charge control related performances in double-gate SOI MOSFETs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 225 | |
dc.source.endpage | 230 | |
dc.source.conference | Silicon-on-Insulator Technology and Devices XI | |
dc.source.conferencedate | 28/04/2003 | |
dc.source.conferencelocation | Paris France | |
imec.availability | Published - open access | |
imec.internalnotes | Electrochemical Society Proceedings; PV 2003-05 |