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Investigation of charge control related performances in double-gate SOI MOSFETs

dc.contributor.authorKilchytska, V.
dc.contributor.authorChung, T.M.
dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorRaskin, J.P.
dc.contributor.authorFlandre, D.
dc.date.accessioned2021-10-15T05:10:18Z
dc.date.available2021-10-15T05:10:18Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7736
dc.sourceIIOimport
dc.titleInvestigation of charge control related performances in double-gate SOI MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage225
dc.source.endpage230
dc.source.conferenceSilicon-on-Insulator Technology and Devices XI
dc.source.conferencedate28/04/2003
dc.source.conferencelocationParis France
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; PV 2003-05


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