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Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs

dc.contributor.authorLartigau, I.
dc.contributor.authorRoutoure, J.M.
dc.contributor.authorCarin, R.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T05:18:46Z
dc.date.available2021-10-15T05:18:46Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7779
dc.sourceIIOimport
dc.titleLow temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage763
dc.source.endpage766
dc.source.conferenceProceedings of the 17th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate18/08/2003
dc.source.conferencelocationPrague Czech Republic
imec.availabilityPublished - imec


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