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Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effects
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Lorentzian noise in ultra-thin gate oxide SOI MOSFETs observed under conditions of a linear kink effects
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Date
2003
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N.
;
Garbar, N.
;
Petrichuk, M.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
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1975
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1975
since deposited on 2021-10-15
1
last month
Acq. date: 2026-01-11
Citations