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Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs
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Authors
Lukyanchikova, N.
;
Simoen, Eddy
;
Mercha, Abdelkarim
;
Claeys, Cor
Conference
NATO Advanced Workshop on Advanced Experimental Methods for Noise Research in Nanoelectronic Devices
Title
Noise and tunnelling through the 2.5 nm gate in SOI MOSFETs
Publication type
Oral presentation
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