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Early resistance change modelling in electromigration

dc.contributor.authorMouthaan, T.
dc.contributor.authorPetrescu, Violeta
dc.contributor.authorSchoenmaker, Wim
dc.contributor.authorGroot, F.
dc.contributor.authorAngelecu, S.
dc.contributor.authorNiehof, J.
dc.contributor.authorProfirescu, M. D.
dc.date.accessioned2021-09-29T13:12:17Z
dc.date.available2021-09-29T13:12:17Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/783
dc.sourceIIOimport
dc.titleEarly resistance change modelling in electromigration
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage311
dc.source.endpage314
dc.source.conference25th European Solid State Device Research Conference - ESSDERC
dc.source.conferencedate25/09/1995
dc.source.conferencelocationDen Haag The Netherlands
imec.availabilityPublished - open access


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