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ESD reliability issues in sub-micron CMOS - trends and challenges

dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorThijs, Steven
dc.contributor.authorDe Heyn, Vincent
dc.contributor.authorDaenen, Tom
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T05:33:11Z
dc.date.available2021-10-15T05:33:11Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7849
dc.sourceIIOimport
dc.titleESD reliability issues in sub-micron CMOS - trends and challenges
dc.typeOral presentation
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorDe Heyn, Vincent
dc.contributor.imecauthorDaenen, Tom
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.conference2nd MRS Int. Conf. on Materials for Advanced Technologies & IUMRS
dc.source.conferencedate7/12/2003
dc.source.conferencelocationSuntec City Singapore
imec.availabilityPublished - imec


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