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In situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems

dc.contributor.authorManca, Jean
dc.contributor.authorGoris, Ludwig
dc.contributor.authorKesters, Els
dc.contributor.authorLutsen, Laurence
dc.contributor.authorMartens, Tom
dc.contributor.authorHaenen, Ken
dc.contributor.authorNesladek, Milos
dc.contributor.authorSanna, Ornella
dc.contributor.authorVanderzande, Dirk
dc.contributor.authorD'Haen, Jan
dc.contributor.authorDe Schepper, Luc
dc.date.accessioned2021-10-15T05:34:06Z
dc.date.available2021-10-15T05:34:06Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7853
dc.sourceIIOimport
dc.titleIn situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems
dc.typeProceedings paper
dc.contributor.imecauthorKesters, Els
dc.contributor.imecauthorLutsen, Laurence
dc.contributor.imecauthorHaenen, Ken
dc.contributor.imecauthorNesladek, Milos
dc.contributor.imecauthorVanderzande, Dirk
dc.contributor.imecauthorD'Haen, Jan
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.beginpage361
dc.source.endpage367
dc.source.conferenceFlexible Electronics. Materials and Device Technology
dc.source.conferencedate21/04/2003
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec
imec.internalnotesMRS Symposium Proceedings; Vol. 769


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