Show simple item record

The challenge of correct modeling and testing of advanced high-speed multi-pins connectors

dc.contributor.authorMartens, Luc
dc.date.accessioned2021-10-15T05:37:55Z
dc.date.available2021-10-15T05:37:55Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7871
dc.sourceIIOimport
dc.titleThe challenge of correct modeling and testing of advanced high-speed multi-pins connectors
dc.typeMeeting abstract
dc.contributor.imecauthorMartens, Luc
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.conferenceFuture Directions in IC and Package Design Workshop - FDIP
dc.source.conferencedate26/10/2003
dc.source.conferencelocationPrinceton, NJ USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
8609.pdf
Size:
176.2Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record