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Liquid helium temperature irradiation effects on 0.7 μm CMOS devices for cryogenic space applications

dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorCreten, Ybe
dc.contributor.authorPutzeys, Jan
dc.contributor.authorDe Moor, Piet
dc.contributor.authorClaeys, Cor
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMohammazadeh, A.
dc.contributor.authorNickson, R.
dc.date.accessioned2021-10-15T05:42:03Z
dc.date.available2021-10-15T05:42:03Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7890
dc.sourceIIOimport
dc.titleLiquid helium temperature irradiation effects on 0.7 μm CMOS devices for cryogenic space applications
dc.typeMeeting abstract
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorPutzeys, Jan
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecPutzeys, Jan::0000-0001-8834-5852
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVan Hoof, Chris::0000-0002-4645-3326
dc.source.peerreviewno
dc.source.conference204th Meeting of the Electrochemical Society: 7th Low Temperature Electronics Symposium
dc.source.conferencedate14/10/2003
dc.source.conferencelocationOrlando, FL USA
imec.availabilityPublished - imec
imec.internalnotesAbstract 888


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