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Low-frequency noise overshoot in ultrathin gate oxide silicon-on-insulator metal-oxide-semiconductor field-effect transistors
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Low-frequency noise overshoot in ultrathin gate oxide silicon-on-insulator metal-oxide-semiconductor field-effect transistors
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Mercha, Abdelkarim
;
Simoen, Eddy
;
van Meer, Hans
;
Claeys, Cor
Journal
Applied Physics Letters
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1853
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations
Metrics
Views
1853
since deposited on 2021-10-15
Acq. date: 2025-12-18
Citations