dc.contributor.author | Mertens, Paul | |
dc.contributor.author | Arnauts, Sophia | |
dc.contributor.author | Bearda, Twan | |
dc.contributor.author | Eitoku, Atsuro | |
dc.contributor.author | Fyen, Wim | |
dc.contributor.author | Hellin, David | |
dc.contributor.author | Holsteyns, Frank | |
dc.contributor.author | Kesters, Els | |
dc.contributor.author | Kraus, Harald | |
dc.contributor.author | Lee, Kuntack | |
dc.contributor.author | Onsia, Bart | |
dc.contributor.author | Rip, Jens | |
dc.contributor.author | Schmidt, H. | |
dc.contributor.author | Snow, Jim | |
dc.contributor.author | Teerlinck, Ivo | |
dc.contributor.author | Vereecke, Guy | |
dc.contributor.author | Vos, Rita | |
dc.contributor.author | Xu, Kaidong | |
dc.contributor.author | Heyns, Marc | |
dc.date.accessioned | 2021-10-15T05:43:49Z | |
dc.date.available | 2021-10-15T05:43:49Z | |
dc.date.issued | 2003 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7898 | |
dc.source | IIOimport | |
dc.title | State-of-the art cleaning in semiconductor manufacturing | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Mertens, Paul | |
dc.contributor.imecauthor | Arnauts, Sophia | |
dc.contributor.imecauthor | Hellin, David | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.imecauthor | Kesters, Els | |
dc.contributor.imecauthor | Onsia, Bart | |
dc.contributor.imecauthor | Rip, Jens | |
dc.contributor.imecauthor | Vereecke, Guy | |
dc.contributor.imecauthor | Vos, Rita | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | 3rd International Workshop on New Trends in Laser Cleaning | |
dc.source.conferencedate | 3/10/2003 | |
dc.source.conferencelocation | Crete Greece | |
imec.availability | Published - open access | |