An active machine vision system for surface quality inspection
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Debusschere, Ingrid | |
dc.contributor.author | Ricquier, Nico | |
dc.contributor.author | Seitz, P. | |
dc.contributor.author | Stalder, M. | |
dc.contributor.author | Raynor, J. | |
dc.contributor.author | Lang, G. | |
dc.contributor.author | Cilia, G. | |
dc.contributor.author | Cavana, C. | |
dc.contributor.author | Müssigmann, U. | |
dc.contributor.author | Abele, A. | |
dc.date.accessioned | 2021-09-29T12:40:09Z | |
dc.date.available | 2021-09-29T12:40:09Z | |
dc.date.issued | 1994 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/78 | |
dc.source | IIOimport | |
dc.title | An active machine vision system for surface quality inspection | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Debusschere, Ingrid | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 205 | |
dc.source.endpage | 213 | |
dc.source.conference | Machine Vision Applications in Industrial Inspection II | |
dc.source.conferencedate | 08/02/1994 | |
dc.source.conferencelocation | San Jose, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 2183 |