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An active machine vision system for surface quality inspection

dc.contributor.authorClaeys, Cor
dc.contributor.authorDebusschere, Ingrid
dc.contributor.authorRicquier, Nico
dc.contributor.authorSeitz, P.
dc.contributor.authorStalder, M.
dc.contributor.authorRaynor, J.
dc.contributor.authorLang, G.
dc.contributor.authorCilia, G.
dc.contributor.authorCavana, C.
dc.contributor.authorMüssigmann, U.
dc.contributor.authorAbele, A.
dc.date.accessioned2021-09-29T12:40:09Z
dc.date.available2021-09-29T12:40:09Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/78
dc.sourceIIOimport
dc.titleAn active machine vision system for surface quality inspection
dc.typeProceedings paper
dc.contributor.imecauthorDebusschere, Ingrid
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage205
dc.source.endpage213
dc.source.conferenceMachine Vision Applications in Industrial Inspection II
dc.source.conferencedate08/02/1994
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - open access
imec.internalnotesProceedings of SPIE; Vol. 2183


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