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Competing hot carrier degradation mechanisms in lateral n-type DMOS transistors

dc.contributor.authorMoens, P.
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-15T05:45:44Z
dc.date.available2021-10-15T05:45:44Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7907
dc.sourceIIOimport
dc.titleCompeting hot carrier degradation mechanisms in lateral n-type DMOS transistors
dc.typeProceedings paper
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.source.peerreviewno
dc.source.beginpage214
dc.source.endpage221
dc.source.conferenceProceedings 41st Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate30/03/2003
dc.source.conferencelocationDallas, TX USA
imec.availabilityPublished - imec


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