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Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
Publication:
Analysis of the early-failure rate prediction of time-dependent dielectric breakdown in thin oxides
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Date
1995
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ogier, Jean-Luc
;
Degraeve, Robin
;
Roussel, Philippe
;
Groeseneken, Guido
;
Maes, Herman
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1991
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-16
Citations
Metrics
Views
1991
since deposited on 2021-09-29
1
last month
Acq. date: 2025-12-16
Citations