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A study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures

dc.contributor.authorOhyama, H.
dc.contributor.authorClaeys, Cor
dc.contributor.authorNakabayashi, H.
dc.contributor.authorMasakazu, T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHanano, M.
dc.contributor.authorNaotika, F.
dc.contributor.authorHirao, T.
dc.date.accessioned2021-10-15T05:51:52Z
dc.date.available2021-10-15T05:51:52Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7935
dc.sourceIIOimport
dc.titleA study on radiation damage of IGBTs by 2-MeV electrons at different irradiation temperatures
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference7th European Conference on Radiation and Its Effects on Components and Systems - RADECS
dc.source.conferencedate15/09/2003
dc.source.conferencelocationNoordwijk The Netherlands
imec.availabilityPublished - imec


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