Degradation and recovery of Si1-xGex devices by irradiation

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Authors
Ohyama, Hidenori; Vanhellemont, Jan; Takami, Y.; Hayama, Kiyoteru; Kudo, T.; Hakata, T.; Kobayashi, K.; Sunaga, H.; Hironaka, I.; Poortmans, Jef; Caymax, Matty
Conference
Strained Layer Epitaxy - Materials, Processing and Device Applications
Title
Degradation and recovery of Si1-xGex devices by irradiation
Publication type
Proceedings paper
Embargo date
9999-12-31
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