Show simple item record

Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorHayama, K.
dc.contributor.authorKuboyama, S.
dc.contributor.authorDeguchi, Y.
dc.contributor.authorMatsuda, S.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T05:53:26Z
dc.date.available2021-10-15T05:53:26Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7942
dc.sourceIIOimport
dc.titleDamage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.beginpage296
dc.source.endpage298
dc.source.journalApplied Physics Letters
dc.source.issue2
dc.source.volume82
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record