Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

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Authors

Ohyama, H.; Takakura, K.; Hayama, K.; Kuboyama, S.; Deguchi, Y.; Matsuda, S.; Simoen, Eddy; Claeys, Cor

Issue

2

Journal

Applied Physics Letters

Volume

82

Title

Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

Publication type

Journal article

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