Publication:
Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes
Date
| dc.contributor.author | Ohyama, H. | |
| dc.contributor.author | Takakura, K. | |
| dc.contributor.author | Hayama, K. | |
| dc.contributor.author | Kuboyama, S. | |
| dc.contributor.author | Deguchi, Y. | |
| dc.contributor.author | Matsuda, S. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-15T05:53:26Z | |
| dc.date.available | 2021-10-15T05:53:26Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7942 | |
| dc.source.beginpage | 296 | |
| dc.source.endpage | 298 | |
| dc.source.issue | 2 | |
| dc.source.journal | Applied Physics Letters | |
| dc.source.volume | 82 | |
| dc.title | Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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