Radiation damage induced in Si photodiodes by High-temerature neutron irradiation

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Authors

Ohyama, H.; Takakura, K.; Matsuoka, H.; Jono, T.; Simoen, Eddy; Claeys, Cor; Uemura, J.; Kishikawa, T.

Issue

5_7

Journal

Journal of Materials Sscience: Materials in Electronics

Volume

14

Title

Radiation damage induced in Si photodiodes by High-temerature neutron irradiation

Publication type

Journal article

Embargo date

9999-12-31

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