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Effects of electron irradiation on IGBT devices

dc.contributor.authorOhyama, H.
dc.contributor.authorTakakura, K.
dc.contributor.authorNakabayashi, M.
dc.contributor.authorHirao, T.
dc.contributor.authorOnoda, S.
dc.contributor.authorKamiya, T.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-15T05:54:05Z
dc.date.available2021-10-15T05:54:05Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7945
dc.sourceIIOimport
dc.titleEffects of electron irradiation on IGBT devices
dc.typeOral presentation
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewno
dc.source.conference16th International Conference on Ion Beam Analysis - IBA
dc.source.conferencedate29/06/2003
dc.source.conferencelocationAlbuquerque, NM USA
imec.availabilityPublished - imec


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