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Radiation damage of Si photodiodes by high-temperature irradiation
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Authors
Ohyama, H.
;
Takakura, K.
;
Shigaki, K.
;
Kuboyama, S.
;
Matsuda, S.
;
Simoen, Eddy
;
Claeys, Cor
Issue
1_4
Journal
Microelectronic Engineering
Volume
66
Title
Radiation damage of Si photodiodes by high-temperature irradiation
Publication type
Journal article
Embargo date
9999-12-31
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