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Perfectly matched layers in semi-analytical techniques
Publication:
Perfectly matched layers in semi-analytical techniques
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Date
2003
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8568.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Olyslager, Frank
;
Derudder, Henk
;
De Zutter, Daniel
;
Rogier, Henk
;
Pissoort, Davy
;
Vande Ginste, Dries
;
Bienstman, Peter
;
Knockaert, Luc
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1894
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations
Metrics
Views
1894
since deposited on 2021-10-15
Acq. date: 2025-12-16
Citations