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A study on the self-heating effect in deep submicrometer partially depleted SOI MOSFET at low temperature

dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorClaeys, Cor
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-15T06:03:30Z
dc.date.available2021-10-15T06:03:30Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/7987
dc.sourceIIOimport
dc.titleA study on the self-heating effect in deep submicrometer partially depleted SOI MOSFET at low temperature
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage112
dc.source.endpage119
dc.source.conferenceProceedings of the 18th Symposium on Microelectronics Technology and Devices - SBMICRO
dc.source.conferencedate8/09/2003
dc.source.conferencelocationSao Paulo Brazil
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. 2003-09


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