dc.contributor.author | Philipsen, Vicky | |
dc.contributor.author | Jonckheere, Rik | |
dc.date.accessioned | 2021-10-15T06:08:03Z | |
dc.date.available | 2021-10-15T06:08:03Z | |
dc.date.issued | 2003-12 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8007 | |
dc.source | IIOimport | |
dc.title | Printability of 2D mask quality | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Philipsen, Vicky | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.orcidimec | Philipsen, Vicky::0000-0002-2959-432X | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.source.peerreview | no | |
dc.source.beginpage | 276 | |
dc.source.endpage | 286 | |
dc.source.conference | 23rd Annual BACUS Symposium on Photomask Technology | |
dc.source.conferencedate | 8/09/2003 | |
dc.source.conferencelocation | Monterey, CA USA | |
imec.availability | Published - imec | |
imec.internalnotes | Proceedings of SPIE; Vol. 5256 | |