Creating spectrally pure signals for ADC-testing

Thumbnail
Metadata
Show full item record
Authors
Rabijns, D.; Vandersteen, Gerd; Van Moer, W.; Rolain, Y.; Schoukens, J.
Conference
Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference - IMTC
Title
Creating spectrally pure signals for ADC-testing
Publication type
Proceedings paper
Collections