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Extension of the compression approach to include device metallizations in electromagnetic simulations

dc.contributor.authorOoms, S.
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-29T13:15:37Z
dc.date.available2021-09-29T13:15:37Z
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/807
dc.sourceIIOimport
dc.titleExtension of the compression approach to include device metallizations in electromagnetic simulations
dc.typeProceedings paper
dc.contributor.imecauthorDe Zutter, Daniel
dc.source.peerreviewno
dc.source.beginpage1054
dc.source.endpage1057
dc.source.conferenceIEEE Antennas and Propagation Society International Symposium.1995 Digest ; 18-23 June 1995; Newport Beach, Calif., USA.
dc.source.conferencelocation
imec.availabilityPublished - imec


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