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Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy

dc.contributor.authorRosenwaks, Y.
dc.contributor.authorSaraf, S.
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-15T06:26:17Z
dc.date.available2021-10-15T06:26:17Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8086
dc.sourceIIOimport
dc.titleDirect measurement of semiconductors surface states parameters using Kelvin probe force microscopy
dc.typeProceedings paper
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.source.peerreviewno
dc.source.conference12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques - STM
dc.source.conferencedate21/07/2003
dc.source.conferencelocationEindhoven The Netherlands
imec.availabilityPublished - imec


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