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A simple method for automated extraction of BJT thermal resistance form early voltage measurements

dc.contributor.authorSadovnikov, A.
dc.contributor.authorKrakowski, T.
dc.contributor.authorGreig, W.
dc.contributor.authorXu, Mingwei
dc.date.accessioned2021-10-15T06:29:31Z
dc.date.available2021-10-15T06:29:31Z
dc.date.issued2003-11
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8099
dc.sourceIIOimport
dc.titleA simple method for automated extraction of BJT thermal resistance form early voltage measurements
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.conference33rd European Solid-State Devices Research Conference - ESSDERC
dc.source.conferencedate16/09/2003
dc.source.conferencelocationEstoril Portugal
imec.availabilityPublished - imec


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