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Degradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation

dc.contributor.authorSimoen, Eddy
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.authorKokkoris, M.
dc.contributor.authorKossionides, E.
dc.contributor.authorFanourakis, G.
dc.contributor.authorMohammadzadeh, A.
dc.date.accessioned2021-10-15T06:43:09Z
dc.date.available2021-10-15T06:43:09Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8155
dc.sourceIIOimport
dc.titleDegradation of deep submicron partially depleted SOI CMOS transistors under MeV proton irradiation
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage18
dc.source.endpage27
dc.source.conferenceProceedings of the 18th Symposium on Microelectronics Technology and Devices - SBMICRO
dc.source.conferencedate8/09/2003
dc.source.conferencelocationSao Paulo Brazil
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. 2003-09


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