Show simple item record

Radiation damage in deep submicron partially depleted SOI CMOS

dc.contributor.authorSimoen, Eddy
dc.contributor.authorRafi, Joan Marc
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSerra-Gallifa, Xavier
dc.contributor.authorvan Meer, Hans
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorClaeys, Cor
dc.contributor.authorKokkoris, M.
dc.contributor.authorKossionides, E.
dc.contributor.authorFanourakis, G.
dc.date.accessioned2021-10-15T06:43:26Z
dc.date.available2021-10-15T06:43:26Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8156
dc.sourceIIOimport
dc.titleRadiation damage in deep submicron partially depleted SOI CMOS
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage437
dc.source.endpage442
dc.source.conferenceSilicon-on-Insulator Technology and Devices XI
dc.source.conferencedate28/04/2003
dc.source.conferencelocationParis France
imec.availabilityPublished - open access
imec.internalnotesElectrochemical Society Proceedings; Vol. 2003-5


Files in this item

Thumbnail
Name:
7275.pdf
Size:
423.1Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record