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Characterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates

dc.contributor.authorSoens, Charlotte
dc.contributor.authorCrunelle, Cathy
dc.contributor.authorWambacq, Piet
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorDonnay, Stephane
dc.contributor.authorRolain, Y.
dc.contributor.authorKuijk, Maarten
dc.contributor.authorBarel, A.
dc.date.accessioned2021-10-15T06:44:16Z
dc.date.available2021-10-15T06:44:16Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8159
dc.sourceIIOimport
dc.titleCharacterization of substrate noise impact on RF CMOS integrated circuits in lightly doped substrates
dc.typeProceedings paper
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage1303
dc.source.endpage1308
dc.source.conferenceProceedings of IMTC - The 20th IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate20/05/2003
dc.source.conferencelocationVail, CO USA
imec.availabilityPublished - imec


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