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RF performance degradation due to coupling of digital switching noise in lightly doped substrates

dc.contributor.authorSoens, Charlotte
dc.contributor.authorCrunelle, Cathy
dc.contributor.authorWambacq, Piet
dc.contributor.authorVandersteen, Gerd
dc.contributor.authorLinten, Dimitri
dc.contributor.authorDonnay, Stephane
dc.contributor.authorRolain, Y.
dc.contributor.authorKuijk, Maarten
dc.contributor.authorBarel, A.
dc.date.accessioned2021-10-15T06:44:33Z
dc.date.available2021-10-15T06:44:33Z
dc.date.issued2003
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/8160
dc.sourceIIOimport
dc.titleRF performance degradation due to coupling of digital switching noise in lightly doped substrates
dc.typeProceedings paper
dc.contributor.imecauthorSoens, Charlotte
dc.contributor.imecauthorWambacq, Piet
dc.contributor.imecauthorVandersteen, Gerd
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorDonnay, Stephane
dc.contributor.orcidimecWambacq, Piet::0000-0003-4388-7257
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecDonnay, Stephane::0000-0003-2489-4793
dc.source.peerreviewno
dc.source.beginpage127
dc.source.endpage132
dc.source.conferenceSouthwest Symposium on Mixed-Signal Design
dc.source.conferencedate23/02/2003
dc.source.conferencelocationLas Vegas, NV USA
imec.availabilityPublished - imec


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