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Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices
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Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Soussan, Philippe
;
Lekens, Geert
;
Dreesen, R.
;
De Ceuninck, Ward
;
Beyne, Eric
Journal
Microelectronics Reliability
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1998
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations
Metrics
Views
1998
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations