Authors

Soussan, Philippe; Lekens, Geert; Dreesen, R.; De Ceuninck, Ward; Beyne, Eric

Issue

9_11

Journal

Microelectronics Reliability

Volume

43

Title

Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices

Publication type

Journal article